► Measurement System
► Physical Electronics (PHI)
► Solar Wafer Counter
► Surface Particle Detector
CAPRES A/S develops new technology for direct nano- and micro-scale electrical characterization of materials. We offer a versatile Microscopic Four- and Twelve Point Probe (M4PP and M12PP) for accurate micro-scale electrical tests.
The M4PP technology and it's unique features have been integrated into state-of-the-art Automatic and Semi Automatic metrology platforms for the thin film and semiconductor industries. The CIPTech is another unique tool from CAPRES A/S developed especially for the MRAM and Read Head industries. The CIPTech features the unique capabilities of the M12PP built into a state-of-the-art semi automatic platform.
Aneric Enterprise Pte Ltd
60 Kaki Bukit Place, #08-19 Eunos Techpark
(Lobby A), Singapore 415979
Tel: +65 6747 0663 Fax: +65 6747 7892
Email: email@example.com, firstname.lastname@example.org
Copyright © 2015 Aneric Enterprise Pte Ltd